Editorial contributions

  1. C. Bolchini, Y. Kim, D. Gizopoulos and M. Tehranipoor, 23rd IEEE Int. Symp. Defect and Fault-Tolerance in VLSI Systems, IEEE Computer Society, 2008. bibtex
    @proceedings{DFT2008ED,
 Booktitle = {DFT},
Doi = {http://dx.doi.org/10.1109/DFT.2008.1},
Editor = {Cristiana Bolchini and Yong-Bin Kim and Dimitris Gizopoulos and Mohammad Tehranipoor},
Publisher = {IEEE Computer Society},
Title = {23rd IEEE Int. Symp. Defect and Fault-Tolerance in VLSI Systems},
Year = {2008},
}
  2. C. Bolchini, Y. B. Kim, A. Salsano and N. Touba, Proc. 22nd IEEE Intl Symp. on Defect and Fault-Tolerance in VLSI Systems, IEEE Computer Society, 2007. bibtex
    @proceedings{DFT2007ED,
Doi = {http://dx.doi.org/10.1109/DFT.2007},
Editor = {Cristiana Bolchini and Y. B. Kim and A. Salsano and N. Touba},
Publisher = {IEEE Computer Society},
Title = {Proc. 22nd IEEE Intl Symp. on Defect and Fault-Tolerance in VLSI Systems},
Year = {2007},
}
  3. C. Bolchini, F. Lombardi, F. J. Meyer, R. Velazco and X. Sun, Proc. 18th IEEE International Symposium Defect and Fault Tolerance in VLSI Systems, IEEE Computer Society, 2003. bibtex
    @proceedings{DFT2003ED,
Doi = {http://doi.ieeecomputersociety.org/10.1109/DFTVS.2003},
Editor = {Cristiana Bolchini and Fabrizio Lombardi and F. J. Meyer and R. Velazco and X. Sun},
Publisher = {IEEE Computer Society},
Title = {Proc. 18th IEEE International Symposium Defect and Fault Tolerance in VLSI Systems},
Year = {2003},
}