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Phase noise degradation at high
oscillation amplitudes
Samori, C.*; Lacaita, A.L.*;
Zanchi, A.*; Levantino, S.*; Calì, G.°
Dipartimento di Elettronica ed Informazione - Politecnico di Milano, Italy ° STMicroelectronics RF Design Group - Catania, Italy |
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Published in : IEEE Journal of Solid-State Circuits Issue January 2000 Vol. 35 Number 1 ISSN: 0018-9200 on Pages: 96 - 99 |
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Abstract :
The paper deals with the Single Sideband to Carrier Ratio (SSCR)
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Subject Terms :
voltage-controlled oscillators; phase noise; LC-tuned VCO; single sideband
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